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020 ▼a 9781687977410
035 ▼a (MiAaPQ)AAI27603083
035 ▼a (MiAaPQ)OhioLINKosu1554299949405238
040 ▼a MiAaPQ ▼c MiAaPQ ▼d 247004
0820 ▼a 621.3
1001 ▼a Gleason, Darryl A.
24510 ▼a Scanned Probe Spectroscopy of Traps in Cross-Sectioned AlGaN/GaN Devices.
260 ▼a [S.l.]: ▼b The Ohio State University., ▼c 2019.
260 1 ▼a Ann Arbor: ▼b ProQuest Dissertations & Theses, ▼c 2019.
300 ▼a 197 p.
500 ▼a Source: Dissertations Abstracts International, Volume: 81-06, Section: B.
500 ▼a Advisor: Pelz, Jonathan.
5021 ▼a Thesis (Ph.D.)--The Ohio State University, 2019.
590 ▼a School code: 0168.
650 4 ▼a Physics.
650 4 ▼a Electrical engineering.
690 ▼a 0605
690 ▼a 0544
71020 ▼a The Ohio State University. ▼b Physics.
7730 ▼t Dissertations Abstracts International ▼g 81-06B.
773 ▼t Dissertation Abstract International
790 ▼a 0168
791 ▼a Ph.D.
792 ▼a 2019
793 ▼a English
85640 ▼u http://www.riss.kr/pdu/ddodLink.do?id=T15495901 ▼n KERIS ▼z 이 자료의 원문은 한국교육학술정보원에서 제공합니다.
980 ▼a 202002 ▼f 2020
990 ▼a ***1816162
991 ▼a E-BOOK