| LDR | | 01287nam u200349 4500 |
| 001 | | 000000457363 |
| 005 | | 20210323092029 |
| 008 | | 210127s2020 |||||||||||||||||c||eng d |
| 020 | |
▼a 9798684655739 |
| 040 | |
▼a 247004
▼c 247004
▼d 247004 |
| 082 | 0 |
▼a 621.3 |
| 100 | 1 |
▼a Mehlman, Jonathan A. |
| 245 | 10 |
▼a On the Scaling of Zinc Oxide Thin-film Transistors. |
| 260 | |
▼a [S.l.]:
▼b Princeton University.,
▼c 2020. |
| 260 | 1 |
▼a Ann Arbor:
▼b ProQuest Dissertations & Theses,
▼c 2020. |
| 300 | |
▼a 438 p. |
| 500 | |
▼a Source: Dissertations Abstracts International, Volume: 82-06, Section: B. |
| 500 | |
▼a Advisor: Sturm, James C. |
| 502 | 1 |
▼a Thesis (Ph.D.)--Princeton University, 2020. |
| 506 | |
▼a This item must not be sold to any third party vendors. |
| 650 | 4 |
▼a Electrical engineering. |
| 710 | 20 |
▼a Princeton University.
▼b Electrical Engineering. |
| 773 | 0 |
▼t Dissertations Abstracts International
▼g 82-06B. |
| 773 | |
▼t Dissertation Abstract International |
| 791 | |
▼a Ph.D. |
| 792 | |
▼a 2020 |
| 793 | |
▼a English |
| 856 | 40 |
▼u http://www.riss.kr/pdu/ddodLink.do?id=T15760689
▼n KERIS
▼z 이 자료의 원문은 한국교육학술정보원에서 제공합니다. |
| 980 | |
▼a 202102
▼f 2021 |
| 990 | |
▼a ***1012033 |
| 991 | |
▼a E-BOOK |