대구한의대학교 향산도서관

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1.
저널기사
Comparative Study on the Structural Dependence of Losic Gate Delays in Double-Gate and Triple-Gate FinFETs: / 김관영 장재만 윤대윤 김동명 김대환 / Institute of Electronics Engineers of Korea / Journal of Semiconductor Technology and Science / 2010 /