대구한의대학교 향산도서관

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검색간략리스트

1.
저널기사
Monte Carlo Simulation Study :the effects of double-paterning versus single-patterning on the line-edge-roughness(LER)in FDSOL Tri-gate MOSFETs: / 박인준 신창원 / Institute of Electronics Engineers of Korea / Journal of Semiconductor Technology and Science / 2013 /