대구한의대학교 향산도서관

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검색간략리스트

1.
저널기사
Characterization of Reactive Ion Etching-Induced Damage to n-GaN Surfaces Using Schottky Diodes: / Ping, A. T.;Schmitz, A. C.;Adesida, I.; / Institute of Electrical and Electronics Engineers / Journal of Electronic Materials / 1997 /