자료유형 | 학위논문 |
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서명/저자사항 | On-Chip Structures for Reliability Management of System-on-Chips. |
개인저자 | Sadi, Mehdi. |
단체저자명 | University of Florida. Electrical and Computer Engineering. |
발행사항 | [S.l.]: University of Florida., 2017. |
발행사항 | Ann Arbor: ProQuest Dissertations & Theses, 2017. |
형태사항 | 130 p. |
기본자료 저록 | Dissertation Abstracts International 79-12B(E). Dissertation Abstract International |
ISBN | 9780438166943 |
학위논문주기 | Thesis (Ph.D.)--University of Florida, 2017. |
일반주기 |
Source: Dissertation Abstracts International, Volume: 79-12(E), Section: B.
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요약 | With aggressive technology scaling in the finfet era the transistor density per unit chip area has increased significantly over the past decade. As a result billion transistor complex System on Chips (SoC) that integrate multicore processors, me |
요약 | Increased functional density with shrinking technology could result in escalating PSN induced failures in the field. To address these issues, a fully digital on-chip distributed sensor network is presented to continuously monitor the PSN profile |
요약 | Because of process variation induced device and interconnect parametric shifts, the post-silicon critical or near-critical paths differ from those identified in the pre-silicon stage. As a result the operating speed or FMAX varies from sample t |
요약 | In this paper, a novel framework is presented for designing lifetime-reliable SoCs with self-adaptation capability against aging induced degradation. The proposed flow utilizes the existing Logic Built In Self Test (LBIST) hardware, and software |
일반주제명 | Computer engineering. Electrical engineering. |
언어 | 영어 |
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