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Defect-Mediated Transformations in Thin Metal Films

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서명/저자사항Defect-Mediated Transformations in Thin Metal Films.
개인저자Ellis, Elizabeth Anne.
단체저자명Cornell University. Mechanical Engineering.
발행사항[S.l.]: Cornell University., 2018.
발행사항Ann Arbor: ProQuest Dissertations & Theses, 2018.
형태사항188 p.
기본자료 저록Dissertation Abstracts International 80-01B(E).
Dissertation Abstract International
ISBN9780438344785
학위논문주기Thesis (Ph.D.)--Cornell University, 2018.
일반주기 Source: Dissertation Abstracts International, Volume: 80-01(E), Section: B.
Adviser: Shefford P. Baker.
요약Thin metal films are widely used in industry, and often show strikingly different behavior than the same material bulk form. Two thin-film phenomena were explored in this work: the beta-to-alpha phase transformation in tantalum thin films, and t
요약To understand the beta-to-alpha phase transformation in Ta films, we first investigated the nature of the metastable beta phase of tantalum. A series of Ta films was deposited in an ultra-high vacuum system under varying Ar sputter pressures to
요약When annealed, these films underwent the beta-to-alpha phase transformation, and electron backscatter diffraction revealed that they formed an unusual microstructure with continuous orientation gradients and discontinuous grain boundaries. The v
요약The (111)-to-(100) texture transformation is a well-known phenomenon occurring in FCC films deposited with (111) fiber texture. Upon annealing, films below some critical thickness retain (111) texture, while those above the critical thickness tr
일반주제명Mechanical engineering.
Materials science.
언어영어
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