상세정보
Export to Refworks부가기능
Developing Advanced Atomic Force Microscopy Techniques for Probing Coupled Phenomena in Functional Materials
상세 프로파일
| 자료유형 | 학위논문 |
|---|---|
| 서명/저자사항 | Developing Advanced Atomic Force Microscopy Techniques for Probing Coupled Phenomena in Functional Materials. |
| 개인저자 | Esfahani, Ehsan Nasr. |
| 단체저자명 | University of Washington. Aeronautics and Astronautics. |
| 발행사항 | [S.l.]: University of Washington., 2018. |
| 발행사항 | Ann Arbor: ProQuest Dissertations & Theses, 2018. |
| 형태사항 | 153 p. |
| 기본자료 저록 | Dissertation Abstracts International 79-12B(E). Dissertation Abstract International |
| ISBN | 9780438173323 |
| 학위논문주기 | Thesis (Ph.D.)--University of Washington, 2018. |
| 일반주기 |
Source: Dissertation Abstracts International, Volume: 79-12(E), Section: B.
Adviser: Jiangyu Li. |
| 요약 | In the last decades, nanotechnology has built great expectations because of its unique capabilities in engineering materials with tailored properties. Exhibiting enhanced physical and chemical properties at length scale on the order of 1{10 nm, |
| 요약 | Atomic Force Microscope (AFM) is a versatile tool for imaging, measurements, and manipulation of matter with nanometer spatial resolution and picometer detection accuracy. Over the last three decades, advanced AFM modes and functionalized probes |
| 요약 | The first goal of this dissertation was to develop advanced excitation, detection, and data analysis techniques that can measure nonlinear phenomena, resolve topographic and feedback cross-talks, and extract intrinsic properties. A multi-harmoni |
| 요약 | The second part of the dissertation deals with novel AFM imaging modes on the foundation of excitation and detection schemes explained in the previous part. Currently, the state-of-the-art AFM imaging modes used to characterize ferroelectric and |
| 일반주제명 | Nanoscience. Applied physics. Materials science. |
| 언어 | 영어 |
| 바로가기 | 
: 이 자료의 원문은 한국교육학술정보원에서 제공합니다. |
