대구한의대학교 향산도서관

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저널기사
Correlating Discrete Orientation and Grain Size to the Sputter Deposition Properties of Tantalum: / Michaluk, C. A.;(http://www.swetsnet.com/link/access_db?issn=03615235&vol=00031&iss=00001&page=2; ) / Institute of Electrical and Electronics Engineers / Journal of Electronic Materials / 2002 /
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