대구한의대학교 향산도서관

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Integrated In Situ Wafer and System Monitoring for the Growth of CdTe/ZnTe/GaAs/Si for Mercury Cadmium Telluride Epitaxy: / Irvine, S. J. C.;Bajaj, J.;Gil, R. V.; / Institute of Electrical and Electronics Engineers / Journal of Electronic Materials / 1995 /
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