대구한의대학교 향산도서관

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Monitoring roughness and edge shape on semiconductors through multiresolution and multivariate image analysis: / Facco, Pierantonio,Bezzo, Fabrizio,Barolo, Massimiliano,Mukherjee, Rajib,Romagnoli, Jose A / American Institute of Chemical Engineers / AICHE Journal / 2009 /
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