대구한의대학교 향산도서관

선택목록저장

검색간략리스트

저널기사
Monte Carlo Simulation Study :the effects of double-paterning versus single-patterning on the line-edge-roughness(LER)in FDSOL Tri-gate MOSFETs: / 박인준 신창원 / Institute of Electronics Engineers of Korea / Journal of Semiconductor Technology and Science / 2013 /
항목 :